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The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.
Author: Daniel J. D. Sullivan, Eric J. Carleton
Binding Type: Paperback
Publisher: de Gruyter
Published: 10/24/2022
Series: de Gruyter Stem
Pages: 128
Weight: 0.48lbs
Size: 9.61h x 6.69w x 0.28d
ISBN: 9781501524783
About the Author
Dr. Daniel J. D. Sullivan
attended Cal & U. C. San Diego. Managed: FA, Reliability and Materials labs. Currently in sales and marketing at EAG labs. He has also written a non-technical book, "Don't Date Crazy" by DJDS, and published a board game called Infection.
Dr. Eric J. Carleton
is a technology developer and consultant who has incubated multiple technology startups, founded Arrhenius, a failure analysis firm, and serves clients in a wide array of industries on scientific analysis and litigation matters.
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