$79.95
Availability: 69 left in stock

This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data....

  • Name : Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization
  • Vendor : Momentum Press
  • Type : Books
  • Manufacturing : 2024 / 08 / 06
  • Barcode : 9781606505885
Categories:

Guaranteed safe checkout:

apple paygoogle paymasterpaypalshopify payvisa
Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization
- +
This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.

Author: Fred Stevie
Binding Type: Paperback
Publisher: Momentum Press
Published: 09/15/2015
Pages: 277
Weight: 0.86lbs
Size: 9.00h x 6.00w x 0.61d
ISBN: 9781606505885

About the Author
Senior Researcher, North Carolina State University

Ezra's Archive Does not ship outside of the United States

Delivery Options:

1. Economy: 

Estimated Delivery Time - 5 to 8 Business Days

Shipping Cost - $4.15

2. USPS Priority:

Estimated Delivery Time - 1 to 3 Business Days 

Shipping Cost - $8.85

3. Free Economy Shipping: Only Applicable to Orders over $60

Returns and Refunds: 

Purchased items are not eligible to be returned. However, a refund or item replacement may be granted should an item be damaged or misplaced during shipping. To make a refund or replacement claim please contact us via email at Ezra'sArchive@outlook.com