Die Theorie und Praxis der Oberfl?chenanalyse wird von Experten mehrerer Fachgebiete erl?utert. Dadurch wird der Leser in die Lage versetzt, Ergebnisse und Datenreihen zu verstehen und umzusetzen.

Author: John C. Vickerman
Binding Type: Paperback
Publisher: Wiley
Published: 05/01/2009
Pages: 688
Weight: 3.2lbs
Size: 9.60h x 6.60w x 1.40d
ISBN: 9780470017647
2nd Edition

About the Author

John C. Vickerman BSc in Chemistry (Edinburgh), Ph.D. in Surface Chemistry (Bristol), DSc (Bristol). Predoctoral fellowships at the Universities of Perugia and Rome, postdoctoral fellowships at the University of Bristol and the Technical University of Eindhoven. Sabbatical study periods at the University of Munich, the Free University of Berlin and Pennsylvania State University.

Dr Ian Gilmore, Surface and Nano-Analysis, National Physical Laboratory, Teddington, UK
Ian is a Principal Research Scientist in the Surface and Nano-Analysis Research team and joined NPL in 1991. His research has a focus on the analysis of complex molecules at surfaces. Recent research has led to the development of a novel new variant of static static SIMS called gentle-SIMS or G-SIMS,
He received a degree in Physics from the University of Manchester in 1991 and a PhD from the University of Loughborough in 2000. Ian is a Fellow of the Institute of Physics a member of the EPSRC College and a member of the American Vacuum Society.